勵威電子股份有限公司（ProbeLeader Co., Ltd）攜PL-Mi6C 被動元件外觀檢查機(jī)將于2015年5月26-28日深圳國際電源工業(yè)及電子變壓器展亮相，展位號：A103。
一、公司簡介：
勵威電子以製造半導(dǎo)體及LCD面板測試用配件，包括探針卡及 Logic & DRAM IC測試插座為主。勵威電子成立於2002年11月，現(xiàn)在擁有新竹香山及大陸無錫兩處生産基地，同時在高雄設(shè)有維修中心。
Established in 2002, ProbeLeader (PL) has been an expert in designing and manufacturing of testing solutions for semiconductor and LCD panel industries. Our products include probe cards, Load-Boards, IC sockets for logic & DRAM ICs…etc. PL owns our production sites in both Hsin-Chu, Taiwan and WuXi, China, as well as a repair center in Kaohsiung.
勵威致力於提供半導(dǎo)體及LCD面板產(chǎn)業(yè)之測試方案，此外亦已跨足光電產(chǎn)業(yè)及被動元件測試產(chǎn)業(yè)等。除了客製化的測試介面設(shè)計(jì)與生產(chǎn)外，服務(wù)內(nèi)容亦包含機(jī)臺代理銷售、機(jī)臺搬遷、機(jī)臺零件更換維修及相關(guān) after service 等。10年以上的專業(yè)被動元件外觀檢查設(shè)備經(jīng)驗(yàn)，提供您最先進(jìn)的元件檢查技術(shù)。
Other than providing testing solutions for semiconductor and LCD panel industries, PL has also extended our business to testing solutions for optoelectronics and passive components. Not only design, manufacture customized testing tools but also deal with sales, relocation, refurbishment and after-services of used-equipments. Professional MicroChip Inspection team, We provide advanced Inspection technology for Passive Component Defect Inspection.
擁有充足產(chǎn)能、穩(wěn)定品質(zhì)、高度彈性配合以及多元化服務(wù)是勵威的優(yōu)勢。我們期待與客戶一同成長並建立長期互信與雙贏之夥伴關(guān)係。
Bountifulproduction-capacity, stable quality and wide range of services with highflexibility are our strength. We look forward to building a long-term, mutualtrusting and win-win relationship with our customers.
二、產(chǎn)品介紹：
PL-Mi6C 被動元件外觀檢查機(jī)PL-Mi6C Micro Chip Inspection System
被動元件外觀檢查機(jī)可以檢驗(yàn)被動元件外觀，如MLCC、MLCI、Chip-R、Network、 Array、Inductors、EMI-Filter、Coil、Ferrite Core…etc，也可以用於其他相關(guān)電子產(chǎn)品以及半導(dǎo)體產(chǎn)業(yè)中前、後段IC的外觀檢測。
The function of Micro Chip Inspection System is to inspect micro multi-layer ceramic chips, such as MLCC and used in the electronic products, front & backend 2D & 3D appearance inspection system for the semiconductor industry. |
